![]() ![]() These and other advances have enabled closely correlated measurements of SAXS with X-ray diffraction (XRD) (Li et al., 2021 ▸) or SANS with neutron diffraction (ND) (Ioannidou et al., 2021 ▸), or even total scattering measurements for short-range order (Kubota et al., 2020 ▸). This has been made possible by advances in detector technologies and beam optics, and in the ongoing development of optimized X-ray and neutron sources, resulting in faster counting times and measurements over more extended q ranges. ![]() Small-angle scattering (SAS), encompassing SAXS and SANS, now plays an increasingly critical role in characterizing phenomena and processes within material systems that act over extended length scales ( e.g. In recent years, small-angle X-ray and neutron scattering (SAXS and SANS) methods have moved significantly beyond their traditional focus on the microstructure characterization of prepared samples, even though this will always be an important part of their remit. In this paper, selected developments are highlighted and some recent state-of-the-art studies discussed, relevant to hard matter applications in advanced manufacturing, energy and climate change. SANS at pulsed neutron sources is becoming more integrated with neutron diffraction methods for simultaneous structure characterization of complex materials. Developments in neutron optics and multiple detector carriages now enable data collection in a few minutes for materials characterization over nanometre-to-micrometre scale ranges, opening up real-time studies of multi-scale materials phenomena. Meanwhile, SANS at both steady-state reactor and pulsed spallation neutron sources has significantly evolved. Elsewhere, X-ray free-electron laser sources provide extremely bright, fully coherent, X-ray pulses of <100 fs and can support SAXS studies of material processes where entire SAXS data sets are collected in a single pulse train. ![]() This results in intense X-ray incident beams that are more compact in the horizontal plane, allowing significantly improved spatial resolution, better time resolution, and a new era for coherent-beam SAXS methods such as X-ray photon correlation spectroscopy. For SAXS, the new generation of diffraction-limited storage rings, incorporating multi-bend achromat concepts, dramatically decrease electron beam emittance and significantly increase X-ray brilliance over previous third-generation sources. Innovations in small-angle X-ray and neutron scattering (SAXS and SANS) at major X-ray and neutron facilities offer new characterization tools for researching materials phenomena relevant to advanced applications. ![]()
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